STEM_Si110_PACBED_test_driver.txt

 Output filename
 STEM_Si110_PACBED\STEM_Si110_PACBED_143A
 Input crystal file name
 xtl_files\Si_110.xtl
 Probe accelerating voltage (kV)
 200
 Slice unit cell <1> yes <2> no
 1
 Number of distinct potentials
    2
<1> manual or <2> auto slicing
    2
 Thickness
   50:300:50     
Scattering factor accuracy
		2
 Tile supercell x
          28
 Tile supercell y
          20
 Number of pixels in x
         1024
 Number of pixels in y
         1024
 <1> continue <2> change
           1
 calculation type
         2
 aperture cutoff
   8.67
 defocus
           0
 Change probe forming lens parameters
           0
 <1> QEP <2> ABS
           2
 <1> Absorption <2> No absorption
           1
 Elastic and inelastic scattering output choice
           1
<0> Continue <1> Beam tilt <2> Specimen tilt
0
 <0> continue <1> save <2> load
        0
 <1> CBED <2> STEM/PACBED
        2
STEM modes
3
STEM modes
0
<1> Diffraction pattern for each probe position
        0
Probe scan menu choice
    1
<0> Proceed <1> Output probe intensity
0